Christen D.K., Thompson J.R., Cook S.W., Selvamanickam V., Chen Y., Kumar D., Zuev Y.L., Polat O., Sinclair J.W.
Ключевые слова: HTS, YBCO, REBCO, composites, coated conductors, substrate Hastelloy, IBAD process, critical caracteristics, current-voltage characteristics, thickness dependence, pinning, Jc/B curves, irreversibility fields, magnetic properties, critical current density, angular dependence, temperature dependence, time evolution, flux creep, n-value, experimental results
Ключевые слова: HTS, YBCO, coated conductors, buffer layers, pinning, PLD process, substrate SrTiO3, films, cap layers, nanoscaled effects, phase formation, phase separation, fabrication, microstructure, size effect, critical caracteristics, Jc/B curves, critical current density, angular dependence, experimental results
Ключевые слова: HTS, YBCO, films, substrate LaAlO3, nanodots, PLD process, pinning, critical current density, temperature dependence, fabrication, critical caracteristics
Ключевые слова: HTS, YBCO, films thick, pinning force, thickness dependence, numerical analysis
Christen D.K., Varela M., Pennycook S.J., Gapud A.A., Viswanathan S.K., Abiade J.T., Kumar D.(dkumar@ncat.edu)
Christen D.K., Feenstra R., Kim K., List F.A., Cook S., Zhang Y., Pennycook S.J., Christen H.M., Tao J., Zuev Y.
Ключевые слова: HTS, YBCO, PLD process, fluorine-free process, films epitaxial, substrate LaAlO3, precursors, comparison, Jc/B curves, inductance, fabrication, critical caracteristics
Jooss C., Varela M., Pennycook S.J., Zhu Y., Klie R.F., Buban J.P., Franceschetti A., Browning N.D., Pantelides S.T.
Goyal A., Paranthaman M., Heatherly L., Leonard K.J., Lee D.F., List F.A., Cook S.W., Martin P.M., Rouleau C.M., Christen H.M.(christenhm@ornl.gov)
Goyal A., Paranthaman M., Heatherly L., Leonard K.J., Lee D.F.(leedf@ornl.gov), List F.A., Cook S.W., Martin P.M., Christen H.M., Rouleau C.M.
Ключевые слова: HTS, YBCO, coated conductors, pulsed electron deposition, ex-situ process, RABITS process, precursors, Jc/B curves, fabrication, critical caracteristics
Christen D.K., Cantoni C., Varela M., Pennycook S.J., Gapud A.A.(gapud@usouthal.edu), Kumar D., Viswanathan S.K., Abiade J.
Specht E.D., Paranthaman M., Christen D.K., Leonard K.J., Thompson J.R., Kang S., List F.A., Martin P.M., Varela M., Pennycook S.J., Ijaduola A.O., Gapud A.A., Goyal A.(goyala@ornl.gov)
Ключевые слова: HTS, YBCO, films, nanodots, defects columnar, pinning, microstructure, Jc/B curves, anisotropy, fabrication, experimental results, critical caracteristics
Thieme C., Goyal A., Specht E.D., Xu Y., Christen D.K., Thompson J.R., Cantoni C., Varela M., Pennycook S.J.
Goyal A., Paranthaman M., Leonard K.J., Sathyamurthy S., Kroeger D.M., Lee D.F.(leedf@ornl.gov), Jr L.H., Yoo J., List F.A., Rutter N., Cook S.W., Martin P.M.
Ключевые слова: HTS, YBCO, coated conductors, substrate Ni-W, RABITS process, fabrication, microstructure, critical current, experimental results, critical caracteristics, length
Goyal A., Paranthaman M., Heatherly L., Leonard K.J., Kroeger D.M., Lee D.F., List F.A., Martin P.M., Cook S., Gapud A.A., Yoo J.(yooj@ornl.gov), Hsu H.S.
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